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[Data] Shirutoku Report No. 53 #Avalanche Test (2)

Explanation using diagrams such as the transient thermal resistance of devices! Calculations will be performed using a MOSFET with appropriate parameters as an example.

★★Shirutoku Report: Useful Information You Can Benefit From★★ This report is a continuation of the discussion on the avalanche rating tests of MOSFETs mentioned in Shirutoku Report No. 52. It explains the relationship between the transient thermal resistance of the device and the loss and time during avalanche operation using diagrams and graphs. When selecting a device, it is not very meaningful to compare devices measured under different conditions. It is recommended to measure in an environment as close to actual operation as possible, rather than relying solely on data sheet values. 【Contents】 ■ Transient thermal resistance of the device ■ Relationship between loss and time during avalanche operation ■ Graph of Tj and time *For more details, please refer to the PDF document or feel free to contact us.

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